That is why it is valuable to study the resistive switching behavior free from the see more forming process. In this regard, the thickness of the

CeO x layer was reduced from 25 to 14 nm in the Zr/CeO x /Pt devices. It is noticed that by reducing the thickness of the CeO x layer, the forming voltage is also reduced. At 14-nm-thick CeO x , the Zr/CeO x /Pt device shows a forming-free behavior, as indicated in Figure 4b. Figure 4b shows the first switching cycle of this device. Initially, the device is in LRS [21], so the first reset process (V off = -1.4 V) is required to initialize the device by rupturing the preformed conductive filaments between two electrodes, and the device is switched to HRS [22]. A unique resistive switching behavior can be obtained without any forming process, which is more advantageous DZNeP research buy for the application point of view [2, 22]. Conversely, a positive voltage (V on) of about +1 V is required for the rapid transition of current from HRS to LRS, called the ‘set process.’ During the set process, oxygen vacancies migrate from the top reservoir (ZrO y layer) and form conducting filaments [2, 4, 13, 20]. A compliance current of 1 mA was applied to prevent the device selleckchem from permanent breakdown. An appropriate negative voltage (-0.7 V) is applied to switch the device from LRS back to HRS. During the reset process, the conductive filament is ruptured

by the reoxidation of oxygen ions [2, 13, 22, 25]. Figure 4 Typical bipolar ( I – V ) curves of resistive switching behavior in Zr/CeO x /Pt devices with different CeO x layer thicknesses. (a) 25 nm and (b) 14 nm. To evaluate the memory switching performance of the Zr/CeO x /Pt device, endurance characteristics are performed. The memory cell is switched successfully in consecutive 104 switching cycles (I-V curves) with approximately 40 resistance ratios between HRS and LRS, as shown in Figure 5. Both HRS and LRS are quite stable and no ‘set fail’ phenomena are observed. Figure 6a shows the statistical distribution of

LRS and HRS of the device. Furthermore, the device has very good uniformity of resistance values in both HRS and LRS. Figure 6b depicts the distribution of set (V Progesterone set) and reset (V reset) voltages for the device, which shows a narrow range of V reset (from -0.5 to -1 V) and V set (from 0.5 to 1.3 V) values. The data retention characteristics of the Zr/CeO x /Pt device are measured at room temperature (RT) and at 85°C, respectively. As shown in Figure 7a, the HRS and LRS are retained stable for more than 104 s at RT and 85°C with a resistance ratio of approximately 102 times at 0.3 V. Hence, suitable read/write durability is obtained. The nondestructive readout property is also verified. As shown in Figure 7b, the two resistance states are stable over 104 s under 0.3 V at RT and 85°C, without any observable degradation.